Hu, Sigui; Wang, Honglei Assurance test and its equivalent truncated sequential test. (English) Zbl 1511.62203 Commun. Stat., Theory Methods 49, No. 11, 2623-2633 (2020). MSC: 62L10 62L05 62N05 × Cite Format Result Cite Review PDF Full Text: DOI
Hu, Sigui; Wang, Honglei Nearly optimal truncated group sequential test on binomial proportions. (English) Zbl 07550139 Commun. Stat., Simulation Comput. 47, No. 8, 2332-2342 (2018). MSC: 62L05 62K05 × Cite Format Result Cite Review PDF Full Text: DOI
Hu, Sigui; Wang, Honglei A heuristic approach for near optimal truncated sequential test of exponential distribution. (English) Zbl 1418.62281 Sequential Anal. 37, No. 4, 431-454 (2018). Reviewer: Allan Gut (Uppsala) MSC: 62L10 × Cite Format Result Cite Review PDF Full Text: DOI